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(April 30, 2008) Niwot, CO — "Collaborative Solutions Beyond 2010" is theme of this year's Global STC Conference, organized by the Semiconductor Test Consortium, Inc. (STC). This interactive global forum, open to both STC member and non-members, will be held on June 4-6, 2008 in San Diego, California.
To reflect the theme of collaboration, the GSC has formed a conference partnership with the IEEE Semiconductor Wafer Test Workshop (SW Test) and the Design Automation Conference (DAC). Both conferences run the week following GSC and will, like GSC, focus on important challenges facing the global semiconductor industry.
Jerry Broz, Ph.D., SW Test-2008 General Chair noted that the partnership reflects overall trends in the consumer environment, in which demanding technical requirements for cost effective test are being aggressively pursued in both probe and tester technologies. "Technical exchange and participant interaction at such international conferences and workshops is a vital element in the pursuit of optimal wafer sort." he said.
Based on feedback from the 2007 event, this third annual GSC will focus on investigating collaborative solutions to address today's most important test challenges. Participants from around the world will attend a wide-breadth of presentations from industry experts representing companies and industry organizations, including those from integrated device manufacturers, electronic design automation firms, and outsourced semiconductor assembly and test companies. Face-to-face STC working group meetings will be scheduled before or after GSC, which are open to GSC attendees on the subjects of: docking and interface, portable test instrument module, probe card, yield enhancement analysis tools and university.
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