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Cascade Microtech's 20 GHz P30 Pyramid Probe for high-volume wafer testing of RF filters and switches uses unique membrane probe technology to reportedly achieve higher yields, lower maintenance and minimal down time. The P30's lithographic probes accuracy are said to alleviate uncontrolled impedance, which is characteristic of other probe types, and their compact size enables multi-site testing.
Needle and spring probes require the device manufacturer to design large IC pads to accommodate a large scrub area. The P30's patented Microscrub creates a smaller scrub mark, reducing the material displacement by 15 times, causing a reduction in particles created during wafer testing. Needle probes also need regular realignment, resulting in down-time during production testing. The P30 Pyramid probes do not require re-alignment.
Incorporating a scalable architecture to support testing from low pin-count filters to high pin-count multi-port RF System-on-Chips (SOC) applications, the Pyramid Plus architecture provides a roadmap for future applications. Configurations ranging from single device to multi-DU improve test cell efficiency. Pyramid probe cards are suited to multi-die testing for RF wireless, high-speed digital in SiPs, SOCs, and leading edge parametrics. Cascade Microtech Beaverton, OR, www.cascademicrotec.com.
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