The Acoustic Surface Profile (ASP) module from Sonoscan allows its C-SAM acoustic microscopes to reveal the external surface topography of a device at the same time as its internal features. It reportedly requires no additional scanning time because profile data is taken at the same time as the acoustic image data. If a part is tilted, ASP corrects for tilt before profiling the surface. ASP can be used to measure warpage of plastic integrated circuits, flip chips, substrates, circuit boards, etc., without any sample preparation. ASP works by collecting acoustic surface data and displaying it as a color-coded image, with each color corresponding to a topographical distance measurement. The sensitivity of the ASP is in the micron range and is not dependant upon the surface smoothness, color, or optical characteristics. ASP is available as anoption on new C-SAM acoustic microscope systems as well as a retrofit to many systems acquired over the last few years. Sonoscan, Inc. Elk Grove Village IL www.sonoscan.com
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